MIT: Independent Activities Period: IAP

IAP 2014

Introduction to Surface Analysis Part 1: Auger Electron Spectroscopy and XPS

Libby Shaw

Jan/21 Tue 02:00PM-05:00PM 13-2137

Enrollment: Unlimited: Advance sign-up required
Sign-up by 01/17
Prereq: none

CMSE's Shared Experimental Facilities include several useful tools for looking at the structure and chemical composition of solid surfaces, with a sampling depth of a few atomic layers. This afternoon seminar is a general introduction to two of these techniques: Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy (XPS). We will summarize how each technique works, its strengths and limitations, and some of the research questions these methods help to answer. See also "Introduction to Surface Analysis Part 2" (Tuesday, January 28).

Sponsor(s): Center for Materials Science and Engineering
Contact: Libby Shaw, 13-4149, x3-5045,