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  Publications
To date, SMA Fellows have published 520 articles in 372 journals while 45 articles have been accepted for publication in 43 journals. Some articles are listed under more than one category.
 

 

Collaborative Research Projects with SMA-MIT Fellows

Advanced Materials for High-Energy/Power Density Lithium Batteries

Journal Publications

  1. Meng Y. S., Ceder G., Grey C .P., Yoon W.-S. & Shao-Horn Y.,“ Understanding the Crystal Structure of Layered LiNi0.5Mn0.5O2 by Electron Diffraction and Powder Diffraction Simulation”, Electrochemical and Solid-State Letters 7(6) (2004) (in press).

  2. Meng Y. S., Wu Y. W., Hwang B. J., Y. Li & Ceder G., “Combining Ab-Initio Computation with Experiments for Designing New Electrode Materials for Advanced Lithium Batteries: LiNi1/3Fe1/6Co1/6Mn1/3O2”, Journal of the Electrochemical Society (2004) (in press).

Conference Publications

  1. Meng Y. S., Li Y. & Ceder G., “Microstructures and Electrochemical Properties of Aluminum-Based Metallic Glass as New Anode Material in Lithium Ion Batteries”, Lithium Battery Discussion LiBD, Arcachon, France, 14-19 September 2003.

  2. Meng Y. S., Ceder G., Carlier D., Gorman J. P., Grey C.P., Yoon W.-S.& Shao-Horn Y., “The Structure of Li(Ni1/2Mn1/2)O2 and Li[NixLi1/3-2x/3Mn2/ 3-x/3]O2: Ab initio Computations and Experiments”, Arcachon, France, 14-19 September 2003.

  3. Meng Y. S., Wu Y. W., Hwang B. J., Li Y. & Ceder G., “Combining Ab-Initio Computation with Experiments for Designing New Electrode Materials for Advanced Lithium Batteries”, Materials Research Society MRS, Boston, USA, 1-5 December 2003.

  4. Meng Y. S., Ceder G., Grey C. P. & Shao-Horn Y., “Cation Ordering and Stacking Sequences in Li[NixLi1/3-2x/3Mn2/3-x/3]O2, International Battery Association Meeting, Graz, Austria, 18-22 April 2004.

  5. Ceder G., Meng Y. S., Shao-Horn Y. & Grey C. P., “Ordering in Li[NixLi1/3- 2x/3Mn2/3-x/3]O2 Systems: Theory and Experiment”, 12th International Meeting on Lithium Batteries, Nara, Japan, 27 June-2 July 2004.

  6. Shao-Horn Y., Meng Y. S., Ceder G., Grey C. P. & Gorman J., “Understanding the Superstructures of Layered O3 Li[NixLi1/3-2x/3Mn2/3-x/3]O2 Compounds”, 12th International Meeting on Lithium Batteries, Nara, Japan, 27 June- 2 July 2004.

              
Bulk Metallic Glasses and their Mechanical Properties

Conference Publication
Tan H., Zhang Y. & Li Y., “La-Al-Cu-Ni Bulk Metallic Glass Composite”, Bulk Metallic Glasses (Bulk Amorphous Alloys) II Conference, Keelung, Taiwan, 22-30 March 2002.

Carbon Nanotubes

Journal Publication
Oon C. H., Thong J. T. L., Lei Y. & Chim W. K., “High-Resolution Atomic Force Microscope Nanotip Grown by Self-Field Emission”, Applied Physics Letters, Vol. 81, pp. 3037 (2002).

Conference Publication
Lei Y., Thong J. T. L., Yeong K. S., Teo L. W., Chim W. K. & Choi W. K., “Highly Ordered Free-Standing Carbon Nanotube Arrays on Silicon”, Proceedings of The International Conference on Carbon in 2002, Beijing, China, 15-20 September 2002.

Copper Reliability

Journal Publications

  1. Gan C. L., Thompson C. V., Pey K. L., Choi W. K., Tay H. L., Yu B.& Radhakrishnan M. K., “Effect of Current Direction on the Lifetime of Different Levels of Cu Dual-Damascene Metallization”, Applied Physics Letters, Vol. 79, pp. 4592 (2001).

  2. Gan C. L., Thompson C. V., Pey K. L. & Choi W. K., “Experimental Characterization and Modeling of the Reliability of 3-Terminal Dual-Damascene Cu Interconnect Trees”, Journal of Applied Physics, Vol. 94, No. 2, pp. 1222-1228 (2003).

    Conference Publications
  3. Gan C. L., Thompson C. V., Pey K. L., Choi W. K., Wei F., Yu B. & Hau-Riege S. P., “Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Tress”, Proceedings of MRS Spring 2002 Meeting.

  4. Wei F., Gan C. L., Thompson C. V., Clement J. J., Hau-Riege S. P., Pey K. L., Choi W. K., Tay H. L., Yu B. & Radhakrishnan M. K., “Length Effects on the Reliability of Dual-Damascene Cu Interconnects”, Proceedings of MRS Spring 2002 Meeting.

  5. Gan C. L., Wei F., Thompson C. V., Pey K. L., Choi W. K. & Yu B., “ Consequence of Preferential Void Formation at the Cu/Si3N4 Interface on the Multiple Failure Mechanisms of Cu Dual-Damascene Metallization”, presented at IPFA2002.

  6. Gan C. L., Thompson C. V., Pey K. L., Choi W. K., Chang C. W. & Guo Q.,“ Effect of Current Direction on the Reliability of Multi-Terminal Cu Dual-Damascene Interconnect Trees”, Proceedings of IEEE IRPS2003, pp. 594-595.

  7. Gan C. L., Wei F., Thompson C. V., Pey K. L., Choi W. K., Hau-Riege S. P.& Yu B., “Contrasting Failure Characteristics of Different Levels of Cu Dual-Damascene Metallization”, 2002 European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Rimini, Italy, 9 October 2002.

  8. Gan C. L., Thompson C. V., Pey K. L., Choi W. K., Chang C. W. & Guo Q.,“ Experimental Characterization of the Reliability of Multi-Terminal Dual-Damascene Copper Interconnect Trees”, MRS 2003, Vol. 766.

  9. Chang C. W., Gan C. L., Thompson C. V., Pey K. L. & Choi W. K, “ Observation of Joule-Heating-Assisted Electromigration Failure Mechanisms for Dual Damascene Cu/SiO2 Interconnects”, Proceedings of IEEE IPFA2003, pp. 69-74.

  10. Chang C. W., Gan C. L., Thompson C. V., Pey K. L., Choi W. K. & Hwang N.“ Mortality Dependence of Cu Dual Damascene Interconnects on Adjacent Segment”, to be presented at MRS’04 Spring meeting, 13-15 April 2004.

Graded InGaN Buffers for Strain Relaxation in InGaN/GaN Epilayers Grown on Sapphire Substrate

Journal Publications

  1. Song T. L., Chua S. J., Fitzgerald E. A., Chen P. & Tripathy S., “Strain Relaxation in Graded InGaN/GaN Epilayers Grown on Sapphire”, Applied Physics Letters, Vol. 83, No. 8, pp. 1545-1547(2003).

  2. Song T. L., Chua S. J., Fitzgerald E. A., Chen P. & Tripathy S., “ Characterization of Graded InGaN/GaN Epilayers Grown on Sapphire”, Journal Vacuum Science and Technology, Vol. A 22(2), pp. 287-292 (2004).

Germanium Nanocrystal Growth and its Applications in Electronic Devices

Journal Publications

  1. Choi W. K., Chim W. K., Heng C. L., Teo L. W., Ho V., Ng V., Antoniadis D. A. & Fitzgerald E. A., “Observation of Memory Effect in Germanium Nanocrystals Embedded in an Amorphous Silicon Oxide Matrix of a Metal-Insulator- Semiconductor Structure”, Applied Physics Letters, Vol. 80, No. 11, pp. 2014 (2002).

  2. Teo L. W., Choi W. K., Chim W. K., Ho V., Tay M. S., Heng C. L., Lei Y., Antoniadis D. A. & Fitzgerald E. A., “Size Control and Charge Storage Mechanism of Germanium Nanocrystals in a Metal-Insulator-Semiconductor Structure”, Applied Physics Letters, Vol. 81, No. 19, pp. 3639 (2002).

  3. Teo L. W., Choi W. K., Chim W. K., Ho V., Moey C. H., Tay M. S., Heng C. L., Lei Y., Antoniadis D. A. & Fitzgerald E. A., “Size Control and Charge Storage Mechanism of Germanium Nanocrystals in a Metal-Insulator-Semiconductor Structure”, Applied Physics Letters, Vol. 81, No. 19, pp. 3639-3641 (2002).

  4. Ho V., Tay M. S., Moey C. H., Teo L. W., Choi W. K., Chim W. K., Heng C. L. & Lei Y., “Electrical Characterization of a Trilayer Germanium Nanocrystal Memory Devices”, Microelectronic Engineering, Vol. 66, pp. 33-38 (2003).

  5. Heng C. L., Teo L. W., Ho V., Tay M. S., Lei Y., Choi W. K. & Chim W. K., “ Effects of Rapid Thermal Annealing Time and Ambient Measurement Temperature on the Charge Storage Capability of a SiO2/Pure Ge/Rapid Thermal Oxide Memory Structure”, Microelectronic Engineering, Vol. 66, pp. 218-223 (2003).
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