Instrument descriptions
JEOL-JXA-8200 Superprobe
The JEOL-JXA-8200 Superprobe was purchased with funding from the National Science Foundation. Important features of this electron microprobe are:
- A LaB6 electron gun that generates higher beam currents with smaller spot size compared to conventional W electron guns.
- A superior electron optical system with a stable beam and automated electron optics that allow changing beam current and accelerating voltage during automated runs.
- Highly sensitive WDS analyzing crystals and detectors allow accurate trace element analysis.
- Ultra-light element detectors capable of detecting atomic numbers 4-9 (Be-F).
- Fast spectrometer and stage motors with excellent step-resolution and reproducibility.
- Optical auto-focusing eliminates the need for Z-axis jogging while saving stage coordinates of points for automated analysis
- Detailed and precise WDS scans allow state analysis (e.g., oxidation state and bonding environment causing wavelength shifts).
- Electron beam autofocus, auto-astigmatism correction, and auto-contrast/brightness provide easier acquisition of high quality images.
- The cathodoluminesence system has wavelength discrimination capability for mapping and spectroscopy that allow phase characterization and identification of trace impurities in minerals.
- Software enhancement enables imaging of irregular shaped planar and curved surfaces.
- Complete remote control.
