Open Courseware:
National Science Foundation
Courses and training
The MIT Electron Microprobe Facility is dedicated to train users of different academic backgrounds in the theory and operation of the electron microprobe. In-depth and hands-on courses are offered to students, researchers, and professionals from the industry.
Courses offered in January during the Independent Activities Period (IAP)
- Credit course: 12.141: Electron Microprobe Analysis
- Lab demo: Electron Microprobe Analysis on the JEOL JXA-8200 Superprobe
Special courses
- JEOL training: Specimen characterization with the Electron Microprobe (EPMA)
- For industry: Electron Microprobe Analysis by Wavelength Dispersive Spectrometry
Other courses that use the electron microprobe
- 12.119: Analytical Techniques for Studying Environmental and Geologic Samples
- 12.108: Structure of Earth Materials
- 12.109: Petrology
Educational outreach
- Introduction and lab tour for Middle School students: Sponsored by the SEED Academy of the MIT Office of Engineering Outreach Programs
- High School senior project: Mentoring program sponsored by the Community Charter School of Cambridge.
Study material:
12.141
Electron Microprobe Analysis
Tue Jan 8, Thurs Jan 10, Tue Jan 15, Thurs Jan 17, 01-05:00pm, 54-1221
Selection by departmental lottery. Do not pre-register on WebSIS.
Enter lottery by: 04-Jan-2013
Limited to 8 participants.
Level: U 6 units Graded P/D/F
Introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix corrections, and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), elemental X-rays with WDS and EDS, and cathodoluminescence (CL); lab sessions will involve hands-on use of the JEOL JXA-8200 Superprobe. This four-session course is offered for undergraduate credit. However, persons interested in an in-depth discussion of quantitative X-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit.
More details: Open Courseware (Course notes available here); IAP for-credit course listing
Please note that selection is by departmental lottery. Do not pre-register on WebSIS. Please complete and submit the following form, or call Dr. Chatterjee at 617-253-1995.
Textbook for reference: Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Material Scientists, and Geologists, Goldstein et al., Plenum Press: New York.
Lab Demo: Electron Microprobe Analysis on JEOL JXA-8200 Superprobe
Dr. Nilanjan Chatterjee
Fri Jan 11, 03-05:00pm, 54-1221
Non-credit activity
No enrollment limit, no advance sign up
Single session event
This session is to introduce new users to the JEOL JXA-8200 Superprobe. You will have hands-on experience (if time permits) on our electron microprobe equipped with enhanced imaging capabilities and learn about wavelength and energy dispersive spectrometry, back-scattered electron, secondary electron, cathodoluminescence, and elemental X-ray imaging. Please complete and submit the following form, or call Dr. Chatterjee at 617-253-1995.
More details: IAP non-credit activity listing
Course for JEOL trainees
Specimen characterization with the Electron Microprobe (EPMA)
This course is open only to JEOL service engineers. You are welcome however to browse through the presentation.
Summer Short Course
Electron Microprobe Analysis by Wavelength Dispersive Spectrometry on the JEOL JXA-8200 Superprobe
This is a hands-on course for professionals from the industry. The availability of this course depends on interest level. Please contact us for details. One-to-one instructions are also available.
