Courses and training
The MIT Electron Microprobe Facility is dedicated to train users of different academic backgrounds in the theory and operation of the electron microprobe. In-depth and hands-on courses are offered to students, researchers, and professionals from the industry.
Courses offered in January during the Independent Activities Period (IAP)
- Credit course: 12.141: Electron Microprobe Analysis
- Lab demo: Electron Microprobe Analysis on the JEOL JXA-8200 Superprobe
- JEOL training: Specimen characterization with the Electron Microprobe (EPMA)
- For industry: Electron Microprobe Analysis by Wavelength Dispersive Spectrometry
Other courses that use the electron microprobe
- 12.119: Analytical Techniques for Studying Environmental and Geologic Samples
- 12.108: Structure of Earth Materials
- 12.109: Petrology
- Introduction and lab tour for Middle School students: Sponsored by the SEED Academy of the MIT Office of Engineering Outreach Programs
- High School senior project: Mentoring program sponsored by the Community Charter School of Cambridge.
Electron Microprobe Analysis
Tue Jan 7, Thurs Jan 9, Tue Jan 14, Thurs Jan 16, 01-05:00pm, 54-1221
Selection by departmental lottery. Do not pre-register on WebSIS.
Enter lottery by: 03-Jan-2014
Limited to 8 participants.
Level: U 6 units Graded P/D/F
Introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix corrections, and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), elemental X-rays with WDS and EDS, and cathodoluminescence (CL); lab sessions will involve hands-on use of the JEOL JXA-8200 Superprobe. This four-session course is offered for undergraduate credit. However, persons interested in an in-depth discussion of quantitative X-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit.
Please note that selection is by departmental lottery. Do not pre-register on WebSIS. Please complete and submit the following form, or call Dr. Chatterjee at 617-253-1995.
Textbook for reference: Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Material Scientists, and Geologists, Goldstein et al., Plenum Press: New York.
Lab Demo: Electron Microprobe Analysis on JEOL JXA-8200 Superprobe
Dr. Nilanjan Chatterjee
Fri Jan 10, 01-03:00pm, 54-1221
No enrollment limit, no advance sign up
Single session event
This session is to introduce new users to the JEOL JXA-8200 Superprobe. You will have hands-on experience (if time permits) on our electron microprobe equipped with enhanced imaging capabilities and learn about wavelength and energy dispersive spectrometry, back-scattered electron, secondary electron, cathodoluminescence, and elemental X-ray imaging. Please complete and submit the following form, or call Dr. Chatterjee at 617-253-1995.
More details: IAP non-credit activity listing
Course for JEOL trainees
This course is open only to JEOL service engineers. You are welcome however to browse through the presentation.
Summer Short Course
This is a hands-on course for professionals from the industry. The availability of this course depends on interest level. Please contact us for details. One-to-one instructions are also available.