Electron Probe Micro-Analysis

Massachusetts Institute of Technology | Earth, Atomospheric & Planetary Sciences (EAPS) | EAPS Research Facilities
subglobal1 link | subglobal1 link | subglobal1 link | subglobal1 link | subglobal1 link | subglobal1 link | subglobal1 link
subglobal2 link | subglobal2 link | subglobal2 link | subglobal2 link | subglobal2 link | subglobal2 link | subglobal2 link
subglobal3 link | subglobal3 link | subglobal3 link | subglobal3 link | subglobal3 link | subglobal3 link | subglobal3 link
subglobal4 link | subglobal4 link | subglobal4 link | subglobal4 link | subglobal4 link | subglobal4 link | subglobal4 link
subglobal5 link | subglobal5 link | subglobal5 link | subglobal5 link | subglobal5 link | subglobal5 link | subglobal5 link
subglobal6 link | subglobal6 link | subglobal6 link | subglobal6 link | subglobal6 link | subglobal6 link | subglobal6 link
subglobal7 link | subglobal7 link | subglobal7 link | subglobal7 link | subglobal7 link | subglobal7 link | subglobal7 link
subglobal8 link | subglobal8 link | subglobal8 link | subglobal8 link | subglobal8 link | subglobal8 link | subglobal8 link

MIT Electron Microprobe Facility

Department of Earth, Atmospheric & Planetary Sciencessmall logo
Building & Room: 54-1221; 54-1214
Cambridge, MA 02139
Phone: (617) 253-9678, or (617) 253-9677
Fax: (617) 253-7102
e-mail: e-probe-www@mit.edu

Back-scattered and secondary electron imaging

The back-scattered electron (BSE) and secondary electron (SE) detectors are mounted inside the sample chamber, which also hosts the EDS detector and the sample stage. The BSE detector is mounted above the sample, whereas, the SE and EDS detectors are mounted on the side. The SE detector provides a topographic image accentuating the fractures, ridges and holes. Below is an SE image of a cross-section of a tree stump:

The BSE detector is most useful in compositional imaging (A+B mode), but it can also be used in a differential mode (A-B mode) to obtain topographic images. Below are BSE images in A+B mode (left) and A-B mode (right) of a Zn-Sn composite:

| Contact Us | ©2009-2014 Massachusetts Institute of Technology