Machines by Subcategory: Thickness
| Process | Lab | Tool | Process Category | Subcategory | Description | |
|---|---|---|---|---|---|---|
| EML | filmetrics | Metrology | Thickness | Thin Film Optical Measurement | ||
| ICL | SM-300 | Metrology | Thickness | Thickness measurement for CMP processing | ||
| ICL | UV1280 | Metrology | Thickness | Thin film characterization | ||
| TRL | ellipsometer-TRL | Metrology | Thickness | Thin film thickness measurement | ||
| TRL | Filmetrics-TRL | Metrology | Thickness | Thin film thickness measurement | ||
| TRL | nanospec | Metrology | Thickness | Thin film thickness measurement |