Machines by Process Category: Metrology
Some tools can measure similar properties (e.g. thin film thickness in the UV1280, Filmetrics-TRL or nanospec), but different physical principles of operation might make one tool a better choice over the other (e.g. when measuring extremely thin dielectric films, the Filmetrics-TRL while a very easy tool to use, may not be the best choice).
Process | Lab | Tool | Subcategory | Description | |
---|---|---|---|---|---|
EML | dektak-EML | Profile | Surface Profilerometer | ||
EML | filmetrics | Thickness | Thin Film Optical Measurement | ||
EML | parametric-tester | Electrical | Probe station for electrical measurements | ||
EML | semNeo | SEM | Very Basic Electron Microscope | ||
ICL | 4-pt-probe | Electrical | Sheet resistance measurement of semiconductors | ||
ICL | AFM | Profile | Atomic Force Microscope for Surface Analysis | ||
ICL | cv | Electrical | Electrical characterization of dielectrics | ||
ICL | P10 | Profile | Stylus profilerometer | ||
ICL | semZeiss | SEM | Scanning Electron Microscope | ||
ICL | SM-300 | Thickness | Thickness measurement for CMP processing | ||
ICL | UV1280 | Thickness | Thin film characterization | ||
ICL | wykoICL | Profile | Optical profiling system | ||
TRL | dek-NoAu | Profile | Stylus Profilerometer | ||
TRL | dektak-XT | Profile | Stylus Profilerometer | ||
TRL | ellipsometer-TRL | Thickness | Thin film thickness measurement | ||
TRL | Filmetrics-TRL | Thickness | Thin film thickness measurement | ||
TRL | FLX | Profile | Thin film stress measurement | ||
TRL | Hall-probe | Electrical | Carrier measurement | ||
TRL | IV-probe | Electrical | Probe station with curve tracer for IV measurement | ||
TRL | nanospec | Thickness | Thin film thickness measurement | ||
TRL | WYKO | Profile | Optical profiling system |