Equipment
| Lab and Coral Name | EML / parametric-tester |
| Model | Hewlett-Packard |
| Specialist | Kurt Broderick (Timothy Turner, Gary Riggott) |
| Physical Location | TBD |
Classification
| Process Category | Metrology |
| Subcategory | Electrical |
| Material Keywords | CMOS Metals, Non-CMOS Metals |
| Sample Size | 6" Wafers, 4" Wafers, Pieces |
| Alternative | ? |
| Keywords | single wafer, manual load, manual operation, alignment |
Description
The parametric-tester is a parametric-tester that measures device characteristics
| Best for | |
| Limitations | |
| Characteristics/FOM | |
| Caution with | |
| Machine Charges | 2/hour |
Documents
Process Matrix Details
PTC Matrix does not apply for EML
Ever been in EMLSamples from EML are never permitted to return to ICL or TRL