Machines by Subcategory: Profile
Process | Lab | Tool | Process Category | Subcategory | Description | |
---|---|---|---|---|---|---|
EML | dektak-EML | Metrology | Profile | Surface Profilerometer | ||
ICL | AFM | Metrology | Profile | Atomic Force Microscope for Surface Analysis | ||
ICL | P10 | Metrology | Profile | Stylus profilerometer | ||
ICL | wykoICL | Metrology | Profile | Optical profiling system | ||
TRL | dek-NoAu | Metrology | Profile | Stylus Profilerometer | ||
TRL | dektak-XT | Metrology | Profile | Stylus Profilerometer | ||
TRL | FLX | Metrology | Profile | Thin film stress measurement | ||
TRL | WYKO | Metrology | Profile | Optical profiling system |