Machines by Subcategory: Profile
| Process | Lab | Tool | Process Category | Subcategory | Description | |
|---|---|---|---|---|---|---|
| EML | dektak-EML | Metrology | Profile | Surface Profilerometer | ||
| ICL | AFM | Metrology | Profile | Atomic Force Microscope for Surface Analysis | ||
| ICL | P10 | Metrology | Profile | Stylus profilerometer | ||
| ICL | wykoICL | Metrology | Profile | Optical profiling system | ||
| TRL | dek-NoAu | Metrology | Profile | Stylus Profilerometer | ||
| TRL | dektak-XT | Metrology | Profile | Stylus Profilerometer | ||
| TRL | FLX | Metrology | Profile | Thin film stress measurement | ||
| TRL | WYKO | Metrology | Profile | Optical profiling system |