Machines by Location: 2F 1-South Metrology
| Process | Lab | Tool | Process Category | Subcategory | Description | |
|---|---|---|---|---|---|---|
| ICL | 4-pt-probe | Metrology | Electrical | Sheet resistance measurement of semiconductors | ||
| ICL | ALD-Oxford | Deposition | CVD, PECVD | Atomic Layer Deposition | ||
| ICL | cv | Metrology | Electrical | Electrical characterization of dielectrics | ||
| ICL | P10 | Metrology | Profile | Stylus profilerometer | ||
| ICL | UV1280 | Metrology | Thickness | Thin film characterization | ||
| ICL | wykoICL | Metrology | Profile | Optical profiling system |