Equipment
Lab and Coral NameTRL / B2-Ox-alloy-Poly
ModelMRL 718
SpecialistBernard Alamariu    (Eric Lim)
Physical Location4F Entry Diffusion
Classification
Process CategoryDiffusion
SubcategoryOxidation
Material KeywordsSilicon, SiO2
Sample Size6" Wafers, 4" Wafers
Alternativenone
Keywordsmulti wafer, manual load, multiple pieces, both sides of sample, conformal dep, temperature, manual operation
Description
This is a LPCVD furnace for deposition of polySi or a-Si onto RED substrates. This is a staff-run tool only.

Best forDeposition of a-Si on Pyrex for wet etch hard mask, deposition of polySi on RED substrates
LimitationsStaff run, appointment must be made with Bernard, Eric or Kris Gases: N2, SiH4
Characteristics/FOMGases: N2, SiH4
Caution withNever put samples with photoresist or residues into the furnace, it will ruin your samples and the furnace!
Machine Charges65/run + 10/um**
Documents

SOP
Tube B2SOP for the tube B2
Process Matrix Details

Permitted
Been in the ALDSamples that have been in any of the ALD systems
,
Pyrex SubstratesPyrex substrates can be a concern due to high sodium content, which contaminates CMOS frontend tools
,
Germanium on surfaceSamples with germanium on the surface (typically grown films)
(A),
Germanium buriedSamples with germanium buried below a different film
,
PiecesWafer pieces may not be handled by the equipment, and are harder to thoroughly clean - preventing them from running in certain tools.
,
Gold or RED color codeRED color code substrates. These are gold-contaminated or have been processed in gold contaminated tools. Gold and other metals can contaminate silicon devices (GREEN color code) and have to be separated.
,
Any exposure to CMOS metalIf the sample had ever seen a CMOS metal (or a tool that accepts CMOS metal), then some frontend tools could be contaminated by this.
,
CMOS metal on surfaceCMOS compatible metals exposed on the surface. These are Al,Ni,Pt,Ti,TiN. Other metals such as Au are *NOT* part of this.
,
CMOS metal buriedCMOS compatible metals covered entirely by a different material. These are Al,Ni,Pt,Ti,TiN. Other metals such as Au are *NOT* part of this.
,
Been in the STS DRIEThe DRIE etch leaves behind polymer residues on the sidewall ripples, which can be a contamination concern for some tools.
,
Been in the SEMA sample viewed in the SEM must have used the appropriate chuck to avoid cross-contamination
(With Appropriate Chuck),
Been in the Concept1The Concep1 deposits dielectrics on GREEN wafers, however it also accepts metal and there can be cross-contamination for diffusion area
,
Coming from KOHAfter a KOH etch, the samples must receive a special clean because the K ions are highly contaminating to CMOS frontend tools
,
Coming from CMPAfter a CMP, the samples must receive a special clean, because the slurry residues otherwise introduce contamination and particles.
,
Requires TRL RCA CleanAn RCA clean in TRL was carried out immediately before
(Must do)

Not Allowed
Ever been in EMLSamples from EML are never permitted to return to ICL or TRL
,
III-V SubstratesAny III-V substrates, e.g. GaAs, GaN, InP, and so on. Note though that many common III-V substrates will also carry the Au flag, but there are some GREEN III-V substrates.
,
Has PhotoresistSamples with photoresist cannot be exposed to high temperatures, which is typical in deposition tools. Outgassing can be a concern.
,
Has PolyimidePolyimide is a very chemically resistant polymer, and can tolerate higher temperatures but cannot be exposed to typical PECVD deposition temperatures or diffusion furnaces. Outgassing can be a concern.
,
Has Cured SU8Not fully cured SU8 residues can heavily contaminated plasma chambers or destroy other user's samples, but fully cured SU8 is permitted in certain tools.


For more details or help, please consult PTC matrix, email ptc@mtl.mit.edu, or ask the research specialist (Bernard Alamariu)